Ключевые слова: HTS, YBCO, thin films, fabrication, substrate single crystal, buffer layers, PLD process, defects columnar, ion irradiation, irradiation effects, pinning, critical caracteristics, anisotropy, Jc/B curves, X-ray diffraction, microstructure, critical current density, angular dependence, n-value, experimental results
Yoshida Y., Izumi T., Shiohara Y., Takahashi Y., Takahashi Y., Kato T., Ichino Y., Takai Y., Yoshizumi M.
Yoshida Y., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Takano Y., Ozaki T.
Ключевые слова: HTS, REBCO, films, nanoscaled effects, nanorods, nanodoping, doping effect, fabrication, microstructure, magnetic properties, irreversibility fields, critical caracteristics, Jc/B curves, critical current density, angular dependence, magnetic field dependence, experimental results, pinning
Yoshida Y., Awaji S., Watanabe K., Shiohara Y., Kato T., Suzuki H., Ichino Y., Takai Y., Yoshizumi M., T.Izumi
Yoshida Y., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Harada T., Kita R., Ozaki T.
Ключевые слова: HTS, REBCO, films, PLD process, fabrication, critical caracteristics, Jc/B curves, critical current density, angular dependence, microstructure
Yoshida Y., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Harada T., Kita R., Ozaki T.
Ключевые слова: HTS, REBCO, films, substrate single crystal, PLD process, fabrication, defects columnar, pinning centers, microstructure
Yoshida Y., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Kita R., Ozaki T., Funaki S.
Yoshida Y., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Kita R., Funaki S.
Ключевые слова: HTS, REBCO, films, nanodoping, nanorods, PLD process, fabrication, substrate single crystal, critical caracteristics, angular dependence
Ключевые слова: HTS, REBCO, films, pinning centers artificial, substrate single crystal, PLD process, LTG process, coated conductors, IBAD process, critical current density, thickness dependence, Jc/B curves, nanoscaled effects, angular dependence, critical caracteristics, fabrication, experimental results
Yoshida Y., Awaji S., Watanabe K., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Miura M., Ozaki T., Masakazu M., Funaki S.
Yoshida Y., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Miura M., Ozaki T.
Yoshida Y., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Miura M., Ozaki T.
Yoshida Y., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Miura M., Funaki S.
Ключевые слова: HTS, YBCO, films, LTG process, dislocations, substrate single crystal, PLD process, Jc/B curves, fabrication, pinning centers, critical caracteristics
Yoshida Y., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Miura M., Ozaki T.
Ключевые слова: HTS, REBCO, films, LTG process, seed layers, PLD process, nanodoping, resistance, magnetic field dependence, irreversibility fields, critical current density, angular dependence, Jc/B curves, pinning force, experimental results, critical caracteristics, fabrication, magnetic properties
Ключевые слова: HTS, REBCO, growth rate, high rate process, films, fabrication
Ichino Y., Takai Y., Mukaida M., Ichinose A., Miura M., Horii S.(tholy@mail.ecc.u-tokyo.ac.jp)
Yoshida Y., Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Miura M.(m_miura@nuee.nagoya-u.ac.jp)
Yoshida Y., Matsumoto K., Ichino Y., Horii S., Mukaida M., Ichinose A., Miura M.(m-miura@ees.nagoya-u.ac.jp), Takai Y.(takai@nuee.nagoya-u.ac.jp)
Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Yoshida Y.(yoshida@nuee.nagoya-u.ac.jp), Miura M.
Matsumoto K., Ichino Y., Takai Y., Horii S., Mukaida M., Ichinose A., Itoh M.(m-ito@ees.nagoya-u.ac.jp), Yoshida Y.(yoshida@nuee.nagoya-u.ac.jp), Miura M.
Ключевые слова: HTS, REBCO, films, substrate single crystal, PLD process, critical current density, fabrication, critical caracteristics, LTG process
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.